What affects electron diffraction?
In the kinematic approximation for electron diffraction, the intensity of a diffracted beam is given by: is the scattering power of the atom, also called the atomic form factor. The sum is over all atoms in the unit cell.
What is Rheed used for?
RHEED is one of the most common and useful in-situ metrology tools used in MBE. It can be used to characterize the crystalline structure, quality and chemical composition of surfaces, measure growth rates, calibrate surface temperatures, and characterize V/III flux ratios (Braun, 1999; Larsen and Dobson, 1988).
What is Laue zone?
Laue zones are defined as the reciprocal lattice planes perpendicular to the direction of the incident beam. The reciprocal lattice points belonging to the same Laue zone appear in a circular or an arc form in a diffraction pattern. …
How diffraction is used in electron microscope?
The use of electromagnetic lenses allows diffracted electrons to be focused into a regular arrangement of diffraction spots that are projected and recorded as the electron diffraction pattern. If the transmitted and the diffracted beams interfere on the image plane, a magnified image of the sample can be observed.
What is refreflection high-energy electron diffraction (RHEED)?
Reflection high-energy electron diffraction (RHEED) is a well-established in situ monitoring technique to observe the crystallinity and morphology of the surface of a growing film, allowing one to distinguish between the three growth modes.
What is a surface-sensitive grazing angle electron diffraction technique?
RHEED is a surface-sensitive grazing angle electron diffraction technique monitoring in situ the electron diffraction pattern generated at the surface of the sample under investigation. As for XRD, the Laue equation describes the diffraction condition.
How is the diffraction pattern of a phosphors screen recorded?
The diffraction pattern is made visible on a phosphors screen and is typically recorded with a CCD (charge coupled device) camera. The distance between diffraction spots or streaks is proportional to the in-plane reciprocal lattice parameter qin-plane as shown in Fig. 5.6.